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なぜ重大な問題を見逃すのか？間違いだらけの設計レビュー 第3版

＜11/20新刊＞『間違いだらけの設計レビュー第3版』

論文
Y. Imanishi, K. Kumon and S. Morisaki, Identifying Defect Injection Risks from Analysis and Design Diagrams: An Industrial Case Study at Sony, 2023 IEEE/ACM 45th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP), 2023, pp. 420-431

Identifying Defect Injection Risks from Analysis and Design Diagrams: An Industrial Case Study at Sony

日経xTech記事
公文 一博、今西 洋二:ソニーが挑むソフト設計工程の改善、欠陥リスクを発見する「パターン」とは

https://xtech.nikkei.com/atcl/nxt/column/18/02403/032300003/

ソニーが挑むソフト設計工程の改善、欠陥リスクを発見する「パターン」とは

論文
P. K. Chittimalli and M. J. Harrold, "Recomputing Coverage Information to Assist Regression Testing," in IEEE Transactions on Software Engineering, vol. 35, no. 4, pp. 452-469

Recomputing Coverage Information to Assist Regression Testing

論文
Arnaoudova, V., Di Penta, M., Antoniol, G., & Guéhéneuc, Y. G. (2013, March). A new family of software anti-patterns: Linguistic anti-patterns. In 2013 17th European conference on software maintenance and reengineering (pp. 187-196). IEEE.

A New Family of Software Anti-patterns: Linguistic Anti-patterns

論文
Krein, J. L., Prechelt, L., Juristo, N., Nanthaamornphong, A., Carver, J. C., Vegas, S., ... & Eggett, D. L. (2015). A multi-site joint replication of a design patterns experiment using moderator variables to generalize across contexts. IEEE Transactions on Software Engineering, 42(4), 302-321.

https://www.inf.fu-berlin.de/inst/ag-se/pubs/KrePreJur16-jointrep.pdf